Year: 2023
The Optical Properties Characterization Of Hydrogenated Silicon By Spectroscopic Ellipsometry For Solar Cell Applications
Araya Mungchamnankit and Puenisara Limnonthakul
Pages: 464
Keywords: spectroscopic ellipsometry, physical model, Tauc-Lorenzt oscillator, very high frequency plasma enhanced chemical vapor deposition
Doi: 10.14458/RSU.res.2023.95